
IXTQ 80N28T
Symbol
Test Conditions
Characteristic Values
TO-3P (IXTQ) Outline
(T J = 25 ° C, unless otherwise specified)
Min.
Typ.
Max.
g fs
C iss
C oss
C rss
t d(on)
t r
t d(off)
t f
Q g(on)
Q gs
Q gd
V DS = 10 V; I D = 0.5 I D25 , pulse test
V GS = 0 V, V DS = 25 V, f = 1 MHz
V GS = 15 V, V DS =220 V, I D = 40A
R G = 5 Ω (External)
V GS = 10 V, V DS = 0.5 V DSS , I D = 0.5 I D25
40
60
5000
510
29
37
47
80
50
115
40
37
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
R thJC
0.25 K/W
R thCK
0.21
K/W
Source-Drain Diode
Characteristic Values
(T J = 25 ° C, unless otherwise specified)
Symbol
Test Conditions
Min.
typ.
Max.
I S
I SM
V SD
T JM
Q RM
V GS = 0 V
Repetitive
I F = I S , V GS = 0 V,
Pulse test, t ≤ 300 μ s, duty cycle d ≤ 2 %
I F = 25 A
-di/dt = 100 A/ μ s
V R = 100 V
200
2
80
240
1.5
A
A
V
ns
μ C
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by
one or moreof the following U.S. patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585
6,759,692
6771478 B2